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A Comprehensive Experimental Design for Measuring the Semiconductor Thin Film Ｒesistance Based on Four Probe Method and Cavendish Twisting Scale with Labview Program
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HUANG Lin，DING Xiaoxia，HAN Lingyun，TANG Yiwen*
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Abstract
A new experiment device for measuring thin film resistance of semiconductor based on four probe method and Cavendish twisting scale has been designed． The semiconductor thin film resistance can be calculated through the measurement of small current ( or voltage) with twisting scale．The process is automated by Labview program．
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Published: 25 February 2022
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