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Preparation and Optical Properties Analysis of Double-layerMesoporous SiO2,Antirefleetion Coating
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ZHANG Zichao,XlAO Zhiwei,JIA Hongbao* ,WANG Ying,ZHU Shihai
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School af Seience, University of Science and Technology Limning, Anshan 114051, China
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Abstract
Using tribloek copolymer F127 and eationie polymerie nanolatex(CPN) as templates, and tetraethylorthosilieate ( TE0S)as the precursor, Si0, solswereprepared in an acid-catalyzed aleohol system, The filmsystem structure was built using Filmstar thin film design software, and a double-ayer broadband antireflectivemesoporous Si0, film with preeisely controllable thickness was prepared on a quartz substrate using the dip-coating method.The morphology, structure , and optical properties of the film were characterized and analyzedusing atomie foree microseopy ( AFM) , seanning eleetron mieroscopy ( SEM ) , transmission eleetron mieroscopy( TEM ) , N, adsorption-desorption analyzer, and [V-visible-near-infrared speetrophotometer.The results showthat the average transmitance of the double dayer mesoporous $i0, antirellective film can reach up to 98,996 inthe 300~800 nm range.
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Published: 25 April 2025
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[1] |
ZHA Haosen , XIAO Zhiwei, WANG Yixiang, JlA Hongbao, ZHU Shihai.
Preparation and Characterization of BroadbandAntireflective Double-Layer Silica Coating
[J]. Physical Experiment of College, 2024, 37(3): 27-32. |
[2] |
LIU Weihui, LIANG Runze , ZHAO Quanxin , ZHUO Chaobo , MIAO Yongping.
Research on the Technology of Liquid Film Thickness Measurement Based on Optical Interferometry
[J]. Physical Experiment of College, 2024, 37(1): 31-36. |
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