Abstract: Targeting micro blind holes with diameters of 0.1~1.0 mm and aspect ratios within 10,this paper
proposes a non-destructive measurement method based on coaxial laser illumination,single-frame imaging,and
image-feature regression.The laser beam is delivered coaxially with the objective through a beam splitter to the
hole bottom,and the reflected light returns along the same axis to the CMOS camera for single-exposure
acquisition.Without z-axis scanning,we extract robust features compatible with the reflection model-such as the
annular bright band,gradient/symmetry cues,and gray-level textures-and build a physics-aware regression from
image features to depth,thereby outputting depth,diameter and aspect ratio. The algorithm automatically
suppresses granular interference and glare,supports ROI auto-localization and outlier rejection,and is
integrated into a GUI for batch measurement and one-click reporting.Experiments on stainless-steel blind-hole
arrays(0.1/0.2/0.3 mm)demonstrate tens-of-micrometers accuracy and stable consistency with third-party
metrology,indicating good engineering applicability for array-level online inspection.