Physical Experiment of College, 2022, 35(2): 94-96    doi: 10.14139/j.cnki.cn22-1228.2022.02.020
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An Automatic Processing System for Measuring Thermal Expansion Coefficient of Michelson Interferometer Based on SCM Technology
CAO Yuxi ,WU Xianglon ,CHEN Kai , LUO Hao*